The TEM Cryo Biasing + Heating Holder enables controlled electrical biasing at cryogenic temperatures while also supporting high-temperature heating experiments inside the TEM. Researchers can cool samples to liquid nitrogen temperatures, apply electrical stimuli through MEMS-based chips, and observe material behavior under stable in-situ imaging conditions.
This holder is designed for experiments where temperature-dependent electrical behavior matters, including quantum materials, battery materials, electronic devices, and low-dimensional systems. It helps researchers study how nanoscale structures respond to electrical biasing across cryogenic and elevated temperature conditions.
Direct chip contact, nine electrical contacts, and integrated temperature and biasing control support repeatable cryo-biasing workflows. The holder is designed for stable imaging and analytical TEM workflows, including EELS and EDS-compatible experiments where low-temperature structure and electrical response must be studied together.
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Hummingbird Scientific designs, machines, assembles, tests, and services in-situ microscopy products with integrated engineering, precision manufacturing, applications, and support teams. For cryogenic biasing and heating workflows, this matters because holder performance depends on the combined behavior of the holder body, Dewar, MEMS chip interface, electrical contacts, temperature control, and microscope integration.
The TEM Cryo Biasing + Heating Holder reflects this system-level approach. Hummingbird supports researchers who need controlled low-temperature electrical biasing, high-temperature heating, stable imaging, and custom workflow modifications for specialized TEM experiments. When needed, our engineering and applications teams can help adapt holder, chip, controller, and software workflows to match demanding research requirements.
Cool samples to cryogenic temperatures while applying electrical stimuli inside the TEM.
Heat samples from cryogenic conditions to elevated temperatures during in-situ TEM experiments.
Use nine electrical contacts to support controlled MEMS-chip biasing workflows.
Use direct chip insertion to support repeatable electrical contact during TEM biasing.
Maintain stable low-temperature imaging with EELS and EDS-compatible TEM workflows.
Control cryogenic cooling, heating, and electrical biasing through an integrated experiment workflow.
The TEM Cryo Biasing + Heating Holder uses a liquid nitrogen Dewar to cool samples to cryogenic temperatures while MEMS-based chips provide direct electrical contact for biasing experiments. Integrated control combines temperature operation and electrical biasing so researchers can cool, heat, bias, and image the same sample inside the TEM.
Direct chip insertion with nine electrical contacts supports repeatable electrical connection while maintaining stable low-temperature imaging and analytical access.
Khim Karki, Daan Hein Alsem, Norman Salmon. “Cryo-Electrical Microscopy for Quantum and Advanced Energy Applications”. Microscopy and Microanalysis (2021)
Hummingbird Control™ supports intuitive operation of the TEM Cryo Biasing + Heating Holder by helping researchers manage temperature control and electrical biasing during in-situ TEM experiments. For workflows that require coordinated setup, experiment organization, and long-term usability, Hummingbird Connect™ can help connect holder operation, microscope context, and experimental metadata into a more structured microscopy workflow.
Together, these software tools help researchers spend less time managing equipment and more time running controlled cryogenic biasing, heating, and analytical TEM experiments.
