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Instrument Type
TEM

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Built on Engineering Excellence

High Impact Publications

James Hart, Michael Jablonski, Andrew Lang, Anoop Damadoran, Shi Liu, Miryam  Arredondo, Lane W. Martin, Anrew Rappe, Taheri Mitra L. “Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In Situ TEM”. Microscopy and Microanalysis(2015)

Ming-Siao Hsiao, Yifei Yuan, Christopher Grabowski, Anmin Nie, Reza Shabazian-Yassar,  Lawrence F. Drummy. “In Situ TEM Characterization of Nanostructured  Dielectrics”. Microscopy and Microanalysis (2015)

William A. Hubbard, E.R. White, Alexander Kerelsky, G. Jasmin, Jared J. Lodico, Matthew Mecklenburg, B.C. Regan. “Time-Resolved Imaging of Electrochemical Switching  in Nanoscale Resistive Memory Elements”. Microscopy and  Microanalysis (2015)

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