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Technical Specs
Instrument Type
TEM

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Built on Engineering Excellence

High Impact Publications

S. Kumar, M. A. Haque, H. Gao. “Notch insensitive fracture in nanoscale thin films”. Applied Physics Letters (2009)

C Winkler, L Martin, C Johnson, M Taheri. “In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias”. Microscopy and Microanalysis (2009)

Stefan Meister, David T. Schoen, Mark A. Topinka, Andrew M. Minor, Yi Cui. “Void Formation Induced Electrical Switching in Phase-Change Nanowires”.  Nano Letters (2008)

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