High-Temperature Heating and Biasing Inside the TEM

The Hummingbird Scientific TEM MEMS Heating + Biasing sample holder enables researchers to heat and electrically bias samples inside the TEM while directly imaging structural, chemical, and electrical changes at the nanoscale. The platform combines MEMS heating chips, on-chip temperature sensing, electrical biasing contacts, and single- or double-tilt configurations for operando materials and device research. Hummingbird Scientific designs, fabricates, and tests its MEMS chips in-house, integrating holder design, chip development, controller technology, applications support, and service within a unified platform.

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Designed for Operando Materials and Device Research

The system supports phase transformations, nanoscale diffusion, electrical transport studies, semiconductor and phase-change materials, 2D materials, catalysts, nanoparticles, thin films, and failure analysis where temperature, bias, structure, and chemistry must be observed simultaneously.

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Observe the Mechanisms Behind Material and Device Behavior

By correlating temperature, electrical stimulus, real-time imaging, and analytical signals inside the TEM, researchers can directly observe the mechanisms that drive material transformation, device performance, and failure.