Print or download this brochure
To download a pdf on your tablet or mobile device, you can select the share option after selecting the button above.
View the full product page

›

TEM Magnetizing

Operando heating, biasing under environmental conditions

In-situ in-plane applied magnetic field

The Hummingbird Scientific TEM Magnetizing holder delivers an in-plane magnetic field to image a sample at the nanoscale using TEM, Lorentz TEM, or electron holography. This enables researchers to investigate the response of materials with unique magnetic charge transport properties such as magnetic alloys, complex oxides, giant/colossal magnetoresistance materials and nanoscale magnetic structures with direct concurrent structural observation.  

‍

Integrated passive magnetic compensation

The >900 Gauss in-plane applied magnetic flux density by nature induces some degree of deflection of the electron beam, distorting the image. Hummingbird Scientific’s one-of-a-kind integrated magnetic beam deflection compensates for this passively by redirecting the current inducing the magnetic field into localized counter-fields above and below the sample that deflect the beam back to the optical axis.

‍

Technical Specs
1700 series
Tilt range
Up to ±45° depending on objective pole
Sample Substrate Size
1x2mm
In-plane applied magnetic flux density
Up to 900 Gauss, depending on microscope and pole piece
Electron imaging
From -300 Oe to +300 Oe applied field depending on microscope and pole piece
Beam Deflection
Integrated passive magnetic beam deflection compensation
TEM Compatibility
TFS/FEI, JEOL, Hitachi
Instrument Type
TEM

Available For:

Key Features and Capabilities

No items found.

Advanced Configuration Options