
The TEM Air-Free Transfer Specimen Holder protects air-sensitive TEM samples during high-vacuum or inert-gas transfer from a preparation environment, with MEMS chip and 3 mm grid versions for different workflows. It is used for samples that degrade, oxidize, or change structure when exposed to air or moisture.
The holder supports two TEM transfer platforms with distinct sample geometries: a MEMS chip version for on-chip electrical biasing and heating, and a standard 3 mm grid version for protected transfer and imaging. The biasing version provides up to 9 electrical contacts for in situ TEM experiments where electrical stimulus and air-free handling are both required.
The system is especially relevant for solid-state electrolyte battery materials, nanoscale semiconductor materials, and other specimens where preparation, transfer, and imaging conditions directly affect measured structure, chemistry, or electrical behavior.