Print or download this brochure
To download a pdf on your tablet or mobile device, you can select the share option after selecting the button above.
View the full product page

›

TEM Air-Free Transfer Holder

Operando heating, biasing under environmental conditions

Air-Free Transfer for Sensitive TEM Samples

The TEM Air-Free Transfer Specimen Holder protects air-sensitive TEM samples during high-vacuum or inert-gas transfer from a preparation environment, with MEMS chip and 3 mm grid versions for different workflows. It is used for samples that degrade, oxidize, or change structure when exposed to air or moisture.

‍

Two Holder Versions for TEM Workflows

The holder supports two TEM transfer platforms with distinct sample geometries: a MEMS chip version for on-chip electrical biasing and heating, and a standard 3 mm grid version for protected transfer and imaging. The biasing version provides up to 9 electrical contacts for in situ TEM experiments where electrical stimulus and air-free handling are both required.

‍

Applications in Energy and Electronic Materials

The system is especially relevant for solid-state electrolyte battery materials, nanoscale semiconductor materials, and other specimens where preparation, transfer, and imaging conditions directly affect measured structure, chemistry, or electrical behavior.

Technical Specs
1580 Series Biasing Transfer
3 mm Sample Transfer
Microscope platform
TEM
High vacuum or inert gas
Transfer environment
High vacuum or inert gas
TEM
Sample format
MEMS chip
3 mm TEM grid
High-vacuum transfer
Yes
Yes
Inert-gas transfer
Yes
Yes
Electrical contacts
Up to 9
0
Contact type
Direct chip contact
N/A
On-chip sample heating
Yes
No
EELS/EDS compatible
Yes
Yes
TEM compatibility
TFS/FEI; JEOL
TFS/FEI; JEOL
Instrument Type
TEM
TEM

Available For:

Key Features and Capabilities

Biasing power supplies

Optional power supplies support compatible electrical biasing experiment configurations.

Specialized sample biasing substrates

Optional substrates support configured sample geometry and biasing requirements.

Hummingbird control electronics

Compatible electronics support configured MEMS heating and biasing workflows.

MEMS heating and biasing chips

Optional MEMS chips support compatible heating and biasing transfer workflows.

Custom configuration path for specialized transfer requirements

Supports engineering discussion for specialized samples, chips, contacts, and microscopes.

EELS and EDS compatibility for analytical TEM workflows

Supports protected transfer before chemical and spectroscopic TEM analysis.

Standard 3 mm grid transfer for conventional TEM characterization

Transfers conventional 3 mm TEM grid specimens without electrical biasing.

Up to 9 electrical contacts for MEMS biasing transfer experiments

Enables MEMS-based biasing and heating workflows after protected sample transfer.

MEMS chip and 3 mm grid platforms for different TEM workflows

Supports MEMS chip-based experiments or standard 3 mm TEM grid transfer.

Vacuum or inert-gas transfer for air-sensitive TEM specimens

Protects sensitive samples during transfer under high vacuum or inert gas.

Advanced Configuration Options