High-Temperature SEM Heating and Biasing on MEMS Chips

The Hummingbird Scientific SEM MEMS Heating + Biasing sample holder enables researchers to heat and electrically bias samples inside the SEM while observing surface morphology, compositional changes, and device response under controlled stimulus. The platform combines MEMS microheater chips, on-chip temperature sensing, direct chip contacts, and integrated controller support for in-situ SEM materials research.

Designed for Device, Catalyst, and Functional Materials Studies

The holder supports experiments involving electrical transport, failure analysis, semiconductor and thin-film materials, catalysts, low-dimensional materials, quantum materials, and temperature-driven transformations where heating, biasing, and SEM imaging must be correlated.

Correlate SEM, TEM, and X-ray Data from Related MEMS Experiments

By combining MEMS heating, electrical biasing, and EDS-compatible SEM analysis, researchers can connect surface morphology, elemental information, temperature, and electrical stimulus. The platform also fits into Hummingbird Scientific’s broader MEMS heating and biasing ecosystem for cross-correlative SEM, TEM, and synchrotron X-ray workflows.