In Situ X-ray Heating and Biasing

The Hummingbird Scientific X-ray MEMS Heating + Biasing sample holder enables researchers to heat and electrically bias samples inside an X-ray microscope or synchrotron X-ray workflow. The platform combines MEMS microheater chips, direct chip contact, electrical biasing contacts, on-chip temperature sensing, and integrated controller technology for controlled in situ materials experiments.

MEMS Chips, Contacts, and Control

The holder supports MEMS heating above 1000 °C with closed-loop control and 4-point resistance sensing. Standard heating/biasing MEMS chips provide 9 electrical contacts, with five available for sample biasing during simultaneous heating and biasing workflows.

Cross-Correlative MEMS Workflows

The platform supports cross-correlative workflows where researchers heat and/or electrically bias related samples across X-ray, SEM, and TEM analysis. This helps compare structural, surface, chemical, and device-response data across complementary imaging systems.